{"id":5105,"date":"2025-11-27T16:42:06","date_gmt":"2025-11-27T14:42:06","guid":{"rendered":"https:\/\/ai.taltech.ee\/?post_type=event&#038;p=5105"},"modified":"2025-11-27T16:45:37","modified_gmt":"2025-11-27T14:45:37","slug":"taltech-ai-open-research-seminar-techniques-for-reliability-in-edge-ai-chips-prof-maksim-jenihhin","status":"publish","type":"event","link":"https:\/\/ai.taltech.ee\/en\/events\/taltech-ai-open-research-seminar-techniques-for-reliability-in-edge-ai-chips-prof-maksim-jenihhin\/","title":{"rendered":"TalTech AI Open Research Seminar \u201cTechniques for Reliability in Edge-AI Chips\u201d \u2013 Prof. Maksim Jenihhin"},"content":{"rendered":"<p><span data-contrast=\"auto\">We are pleased to invite all TalTech academic staff to the next session in the TalTech AI monthly research seminar series, taking place on <\/span><b><span data-contrast=\"auto\">Tuesday, 2 December<\/span><\/b><span data-contrast=\"auto\">, from <\/span><b><span data-contrast=\"auto\">15:00\u201316:30 in SOC-312<\/span><\/b><span data-contrast=\"auto\">.<\/span><span data-ccp-props=\"{&quot;134233117&quot;:false,&quot;134233118&quot;:false,&quot;335559738&quot;:240,&quot;335559739&quot;:240}\">\u00a0<\/span><\/p>\n<p><span data-contrast=\"auto\">This month\u2019s speaker is <\/span><b><span data-contrast=\"auto\">Maksim Jenihhin<\/span><\/b><span data-contrast=\"auto\">, Associate Professor of Computing Systems Reliability and Head of the <\/span>Trustworthy and Efficient Computing Hardware (TECH)<span data-contrast=\"auto\"> research group at TalTech. His talk <\/span>\u201cTechniques for Reliability in Edge-AI Chips\u201d<span data-contrast=\"auto\">, will explore how to ensure reliability and energy efficiency in AI-accelerating edge devices.<\/span><span data-ccp-props=\"{&quot;134233117&quot;:false,&quot;134233118&quot;:false,&quot;335559738&quot;:240,&quot;335559739&quot;:240}\">\u00a0<\/span><\/p>\n<p><b><span data-contrast=\"auto\">Talk abstract:<\/span><\/b><br \/>\n<span data-contrast=\"auto\"> AI applications increasingly rely on a hybrid cloud\u2013edge computing paradigm, keeping complex model training in the cloud while performing fast, efficient inference at the edge. This shift establishes the concept of Edge AI and introduces new reliability requirements for the underlying hardware, especially in safety- and mission-critical systems. The talk discusses techniques for assessing and improving soft-error and lifetime reliability in Deep Learning accelerators, examines the use of approximate computing and quantization, and highlights architectural considerations for ASIC and FPGA-based accelerators.<\/span><span data-ccp-props=\"{&quot;134233117&quot;:false,&quot;134233118&quot;:false,&quot;335559738&quot;:240,&quot;335559739&quot;:240}\">\u00a0<\/span><\/p>\n<p><span data-contrast=\"auto\">The talk will be followed by <\/span>open discussion and networking<span data-contrast=\"auto\"> over coffee and light snacks. The talk will also be streamed via Teams, but we strongly encourage in-person participation to benefit from the discussions.<\/span><span data-ccp-props=\"{}\">\u00a0<\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>This month\u2019s speaker is Maksim Jenihhin, Associate Professor of Computing Systems Reliability and Head of the Trustworthy and Efficient Computing Hardware (TECH) research group at TalTech. His talk \u201cTechniques for Reliability in Edge-AI Chips\u201d, will explore how to ensure reliability and energy efficiency in AI-accelerating edge devices.\u00a0<\/p>\n","protected":false},"featured_media":0,"template":"","language_tax":[339],"audience_tax":[355,350,351,353,354],"status_tax":[257],"type_tax":[364],"sector_tax":[],"class_list":["post-5105","event","type-event","status-publish","hentry","language_tax-english","audience_tax-teacher","audience_tax-taltech-ai-community","audience_tax-taltech-internal","audience_tax-scientist","audience_tax-student","status_tax-moodunud","type_tax-seminars"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.6 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>TalTech AI Open Research Seminar \u201cTechniques for Reliability in Edge-AI Chips\u201d \u2013 Prof. Maksim Jenihhin | AI Focus Center<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/ai.taltech.ee\/en\/events\/taltech-ai-open-research-seminar-techniques-for-reliability-in-edge-ai-chips-prof-maksim-jenihhin\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"TalTech AI Open Research Seminar \u201cTechniques for Reliability in Edge-AI Chips\u201d \u2013 Prof. Maksim Jenihhin | AI Focus Center\" \/>\n<meta property=\"og:description\" content=\"This month\u2019s speaker is Maksim Jenihhin, Associate Professor of Computing Systems Reliability and Head of the Trustworthy and Efficient Computing Hardware (TECH) research group at TalTech. His talk \u201cTechniques for Reliability in Edge-AI Chips\u201d, will explore how to ensure reliability and energy efficiency in AI-accelerating edge devices.\u00a0\" \/>\n<meta property=\"og:url\" content=\"https:\/\/ai.taltech.ee\/en\/events\/taltech-ai-open-research-seminar-techniques-for-reliability-in-edge-ai-chips-prof-maksim-jenihhin\/\" \/>\n<meta property=\"og:site_name\" content=\"AI Focus Center\" \/>\n<meta property=\"article:modified_time\" content=\"2025-11-27T14:45:37+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/events\\\/taltech-ai-open-research-seminar-techniques-for-reliability-in-edge-ai-chips-prof-maksim-jenihhin\\\/\",\"url\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/events\\\/taltech-ai-open-research-seminar-techniques-for-reliability-in-edge-ai-chips-prof-maksim-jenihhin\\\/\",\"name\":\"TalTech AI Open Research Seminar \u201cTechniques for Reliability in Edge-AI Chips\u201d \u2013 Prof. Maksim Jenihhin | AI Focus Center\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/#website\"},\"datePublished\":\"2025-11-27T14:42:06+00:00\",\"dateModified\":\"2025-11-27T14:45:37+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/events\\\/taltech-ai-open-research-seminar-techniques-for-reliability-in-edge-ai-chips-prof-maksim-jenihhin\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/events\\\/taltech-ai-open-research-seminar-techniques-for-reliability-in-edge-ai-chips-prof-maksim-jenihhin\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/events\\\/taltech-ai-open-research-seminar-techniques-for-reliability-in-edge-ai-chips-prof-maksim-jenihhin\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Blog\",\"item\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"S\u00fcndmused\",\"item\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/events\\\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"TalTech AI Open Research Seminar \u201cTechniques for Reliability in Edge-AI Chips\u201d \u2013 Prof. Maksim Jenihhin\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/#website\",\"url\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/\",\"name\":\"Tehisintellekti fookustippkeskus\",\"description\":\"AI Focus Center\",\"publisher\":{\"@id\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/#organization\",\"name\":\"TalTech\",\"url\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/ai.taltech.ee\\\/wp-content\\\/uploads\\\/2024\\\/11\\\/taltech-favorites.png\",\"contentUrl\":\"https:\\\/\\\/ai.taltech.ee\\\/wp-content\\\/uploads\\\/2024\\\/11\\\/taltech-favorites.png\",\"width\":512,\"height\":512,\"caption\":\"TalTech\"},\"image\":{\"@id\":\"https:\\\/\\\/ai.taltech.ee\\\/en\\\/#\\\/schema\\\/logo\\\/image\\\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"TalTech AI Open Research Seminar \u201cTechniques for Reliability in Edge-AI Chips\u201d \u2013 Prof. Maksim Jenihhin | AI Focus Center","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/ai.taltech.ee\/en\/events\/taltech-ai-open-research-seminar-techniques-for-reliability-in-edge-ai-chips-prof-maksim-jenihhin\/","og_locale":"en_US","og_type":"article","og_title":"TalTech AI Open Research Seminar \u201cTechniques for Reliability in Edge-AI Chips\u201d \u2013 Prof. Maksim Jenihhin | AI Focus Center","og_description":"This month\u2019s speaker is Maksim Jenihhin, Associate Professor of Computing Systems Reliability and Head of the Trustworthy and Efficient Computing Hardware (TECH) research group at TalTech. 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